ФЕДЕРАЛЬНОЕ ГОСУДАРСТВЕННОЕ БЮДЖЕТНОЕ УЧРЕЖДЕНИЕ НАУКИ
НАУЧНО-ТЕХНОЛОГИЧЕСКИЙ ЦЕНТР МИКРОЭЛЕКТРОНИКИ И
СУБМИКРОННЫХ ГЕТЕРОСТРУКТУР РОССИЙСКОЙ АКАДЕМИИ НАУК
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METROLOGY AND DIAGNOSTICS

In 2008-2010 the Center was retooled by the modern metrological equipment, based on which the measurement and diagnostic complex was produced to control and study electrical, optical, spectral, and thermal characteristics of semiconductor nanoheterostructures, lasers, LEDs, abd solids light sources. The dedicated measuring complex is intended for precise control over the characteristics of devices as well as to carry out life-time and climatic tests; the complex includes the equipment of the leading producers such as Optronic Laboratories Inc., Radiant Imaging Inc., Janis Research Company Inc., Ocean Optics Inc., Avantes BV, Tektronix Inc., Agilent Technologies Inc., MicRed Ltd., Keithley, and novel IR thermal imaging microscope developed in the Institute of Semiconductor Physics of the Siberian Branch of the RAS.